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ALUMINUM AND NICKEL CONTACT METALLIZATIONS ON THIN-FILM DIAMOND

CHAN, SSM; PEUCHERET, C; MCKEAG, RD; JACKMAN, RB; JOHNSTON, C; CHALKER, PR; (1995) ALUMINUM AND NICKEL CONTACT METALLIZATIONS ON THIN-FILM DIAMOND. JOURNAL OF APPLIED PHYSICS , 78 (4) pp. 2877-2879. 10.1063/1.360096.

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Type: Article
Title: ALUMINUM AND NICKEL CONTACT METALLIZATIONS ON THIN-FILM DIAMOND
DOI: 10.1063/1.360096
Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, FIELD-EFFECT TRANSISTORS, POLYCRYSTALLINE DIAMOND, SEMICONDUCTING DIAMOND, ELECTRICAL-PROPERTIES, RECTIFYING CONTACTS, SCHOTTKY DIODES
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/138903
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