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An X-ray photoelectron spectroscopic investigation of the oxidation of manganese

Foord, JS; Jackman, RB; Allen, GC; (1984) An X-ray photoelectron spectroscopic investigation of the oxidation of manganese. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties , 49 (5) pp. 657-663. 10.1080/01418618408233293.

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Abstract

X-ray photoelectron spectroscopy has been used to investigate a range of manganese oxide compounds and the initial stages of oxidation of manganese metal. It is shown that the Mn 2p 3/2 binding energy, the extent of multiplet splitting of the 3s level, and the O Is: Mn 2p 3/2 signal intensity ratio vary systematically between the different oxides. This information is used to identify oxide species present on the surface of manganese films during oxidation. A reaction sequence Mn→MnO→Mn 2 O 3 →MnO 2 is demonstrated. © 1984 Taylor & Francis Group, LLC.

Type: Article
Title: An X-ray photoelectron spectroscopic investigation of the oxidation of manganese
DOI: 10.1080/01418618408233293
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/138865
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