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Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs

Panfilova, M; Pawlis, A; Arens, C; de Vasconcellos, SM; Berth, G; Huesch, KP; Wiedemeier, V; ... Lischka, K; + view all (2009) Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. In: (Proceedings) Symposium on Wide Band Gap Semiconductor Nanostructures for Optoelectronic Applications held at the 2008 E-MRS Conference. (pp. pp. 221-223). ELSEVIER SCI LTD

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Type: Proceedings paper
Title: Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs
Event: Symposium on Wide Band Gap Semiconductor Nanostructures for Optoelectronic Applications held at the 2008 E-MRS Conference
Location: Strasbourg, FRANCE
Dates: May 2008
DOI: 10.1016/j.mejo.2008.07.056
Keywords: Science & Technology, Technology, Engineering, Electrical & Electronic, Nanoscience & Nanotechnology, Engineering, Science & Technology - Other Topics, Raman, Photoluminescence, Microdisc, ZnSe, SCATTERING, PLASMON, LASERS, MODES, GAAS
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/1385695
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