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THE DIELECTRIC STRENGTH OF CO2-LASER GROWN SILICON DIOXIDE

BOYD, IW; WILSON, JIB; (1984) THE DIELECTRIC STRENGTH OF CO2-LASER GROWN SILICON DIOXIDE. SOLID-STATE ELECTRONICS , 27 (2) pp. 209-211. 10.1016/0038-1101(84)90115-1.

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Type: Article
Title: THE DIELECTRIC STRENGTH OF CO2-LASER GROWN SILICON DIOXIDE
DOI: 10.1016/0038-1101(84)90115-1
Keywords: Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Physics, Applied, Physics, Condensed Matter, Engineering, Physics
UCL classification: UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/1384261
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