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TEMPORALLY RESOLVED IMAGING OF SILICON SURFACES MELTED WITH INTENSE PICOSECOND 1-MU-M LASER-PULSES

BOYD, IW; MOSS, SC; BOGGESS, TF; SMIRL, AL; (1985) TEMPORALLY RESOLVED IMAGING OF SILICON SURFACES MELTED WITH INTENSE PICOSECOND 1-MU-M LASER-PULSES. APPLIED PHYSICS LETTERS , 46 (4) pp. 366-368. 10.1063/1.95633.

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Type: Article
Title: TEMPORALLY RESOLVED IMAGING OF SILICON SURFACES MELTED WITH INTENSE PICOSECOND 1-MU-M LASER-PULSES
DOI: 10.1063/1.95633
Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED
UCL classification: UCL > School of BEAMS
UCL > School of BEAMS > Faculty of Maths and Physical Sciences
UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/1384259
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