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Atomic force microscope nanolithography of graphene: Cuts, pseudocuts, and tip current measurements

Puddy, RK; Scard, PH; Tyndall, D; Connolly, MR; Smith, CG; Jones, GAC; Lombardo, A; ... Buitelaar, MR; + view all (2011) Atomic force microscope nanolithography of graphene: Cuts, pseudocuts, and tip current measurements. APPLIED PHYSICS LETTERS , 98 (13) 10.1063/1.3573802.

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Type: Article
Title: Atomic force microscope nanolithography of graphene: Cuts, pseudocuts, and tip current measurements
DOI: 10.1063/1.3573802
Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, SINGLE-ELECTRON TRANSISTOR, QUANTUM DOTS, LITHOGRAPHY, FABRICATION
URI: http://discovery.ucl.ac.uk/id/eprint/1366980
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