Oberbeck, L and Curson, NJ and Hallam, T and Simmons, MY and Bilger, G and Clark, RG (2004) Measurement of phosphorus segregation in silicon at the atomic scale using scanning tunneling microscopy. Applied Physics Letters , 85 (8) 1359 - 1361.
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|Title:||Measurement of phosphorus segregation in silicon at the atomic scale using scanning tunneling microscopy|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology|
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