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Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

Valev, VK; De Clercq, B; Zheng, X; Biris, CG; Panoiu, NC; Silhanek, AV; ... Verbiest, T; + view all (2012) Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. NANOPHOTONICS IV , 8424 , Article ARTN 842411. 10.1117/12.922880.

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Type:Article
Title:Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
DOI:10.1117/12.922880
Keywords:Second Harmonic Generation, metamaterials, nanostructures, plasmonics
UCL classification:UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering

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