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Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

Valev, VK; De Clercq, B; Zheng, X; Biris, CG; Panoiu, NC; Silhanek, AV; Volskiy, V; (2012) Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. NANOPHOTONICS IV , 8424 (ARTN 842) 10.1117/12.922880.

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Type: Article
Title: Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
Location: Brussels, BELGIUM
DOI: 10.1117/12.922880
Keywords: Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Optics, Physics, Applied, Engineering, Physics, Second Harmonic Generation, metamaterials, nanostructures, plasmonics, NANOSTRUCTURES, NANOPARTICLES, SILVER, FILMS
UCL classification: UCL > School of BEAMS
UCL > School of BEAMS > Faculty of Engineering Science
URI: http://discovery.ucl.ac.uk/id/eprint/1360354
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