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Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

Valev, VK; Verbiest, T; De Clercq, B; Ameloot, M; Zheng, X; Volskiy, V; ... Moshchalkov, VV; + view all (2012) Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. Proceedings of SPIE - The International Society for Optical Engineering , 8424 10.1117/12.922880.

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Abstract

Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results. © 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

Type:Article
Title:Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
DOI:10.1117/12.922880
UCL classification:UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering

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