UCL logo

UCL Discovery

UCL home » Library Services » Electronic resources » UCL Discovery

Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

Valev, VK; De Clercq, B; Zheng, X; Biris, CG; Panoiu, NC; Silhanek, AV; Volskiy, V; (2012) Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. NANOPHOTONICS IV , 8424 , Article ARTN 842411. 10.1117/12.922880.

Full text not available from this repository.
Type: Article
Title: Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
DOI: 10.1117/12.922880
Keywords: Second Harmonic Generation, metamaterials, nanostructures, plasmonics
UCL classification: UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering
URI: http://discovery.ucl.ac.uk/id/eprint/1360354
Downloads since deposit
0Downloads
Download activity - last month
Download activity - last 12 months
Downloads by country - last 12 months

Archive Staff Only

View Item View Item