Valev, VK and De Clercq, B and Zheng, X and Biris, CG and Panoiu, NC and Silhanek, AV and Volskiy, V and Aktsipetrov, OA and Vandenbosch, GAE and Ameloot, M and Moshchalkov, VV and Verbiest, T (2012) Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. Proceedings of SPIE - The International Society for Optical Engineering , 8424
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| Type: | Article |
|---|---|
| Title: | Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials |
| UCL classification: | UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering |
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