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Non-destructive assessment of semiconductor carrier lifetime using photothermal radiometry

Amirhaghi, S; Kenyon, AJ; Federighi, M; Pitt, CW; (1996) Non-destructive assessment of semiconductor carrier lifetime using photothermal radiometry. MATERIALS RELIABILITY IN MICROELECTRONICS VI , 428 pp. 455-460. 10.1557/PROC-428-455.

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Type: Article
Title: Non-destructive assessment of semiconductor carrier lifetime using photothermal radiometry
Location: SAN FRANCISCO, CA
DOI: 10.1557/PROC-428-455
Keywords: Science & Technology, Technology, Materials Science, Multidisciplinary, Materials Science, Characterization & Testing, Materials Science
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: http://discovery.ucl.ac.uk/id/eprint/1354960
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