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Chemistry of post-annealing of epitaxial CoFe2O4 thin films

Axelsson, AK; Valant, M; Fenner, L; Wills, AS; Alford, NM; (2009) Chemistry of post-annealing of epitaxial CoFe2O4 thin films. THIN SOLID FILMS , 517 (13) 3742 - 3747. 10.1016/j.tsf.2009.01.142.

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CoFe2O4 thin films of different thicknesses were grown on SrTiO3 substrates. The X-ray diffraction analysis and atomic force microscopy indicated both epitaxy and a granular microstructure. We studied the magnetic properties of these films as a function of oxygen post-annealing and film thickness. All as-deposited films exhibited similar magnetic properties with saturated magnetization (M-s) of approximately 50% of the bulk M-s, (80 Am-2 kg(-1)). After the post-annealing the M-s changes as a consequence of crystallographic restructuring of the film. Cation ordering in 100 nm thick films reduces M-s, whereas re-oxidation increases M-s for thinner films. 13 nm films, annealed for 1 h, reach the bulk M-s. For even thinner films the quantum-size effect reduces M-s. For a synthesis of >= 30 nm films an annealing cycle after deposition of every 15 nm layer is recommended. (C) 2009 Elsevier B.V. All rights reserved.

Type: Article
Title: Chemistry of post-annealing of epitaxial CoFe2O4 thin films
DOI: 10.1016/j.tsf.2009.01.142
Keywords: Annealing, Cobalt ferrite, Pulsed laser deposition, Cation ordering, PULSED-LASER DEPOSITION, MAGNETIC-ANISOTROPY, SPINEL, GROWTH
UCL classification: UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry
URI: http://discovery.ucl.ac.uk/id/eprint/134916
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