Villis, BJ; Orlov, AO; Jehl, X; Snider, GL; Fay, P; Sanquer, M; (2011) Defect detection in nano-scale transistors based on radio-frequency reflectometry. APPLIED PHYSICS LETTERS , 99 (15) , Article ARTN 152106. 10.1063/1.3647555.
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|Title:||Defect detection in nano-scale transistors based on radio-frequency reflectometry|
|Keywords:||elemental semiconductors, insulated gate field effect transistors, nanoelectronics, reflectometry, silicon, single electron transistors|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology|
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