McMillan, PF; Daisenberger, D; Cabrera, RQ; Meersman, F; (2010) AMORPHOUS X-RAY DIFFRACTION AT HIGH PRESSURE: POLYAMORPHIC SILICON AND AMYLOID FIBRILS. In: Boldyreva, E and Dera, P, (eds.) HIGH-PRESSURE CRYSTALLOGRAPHY: FROM FUNDAMENTAL PHENOMENA TO TECHNOLOGICAL APPLICATIONS. (pp. 469 - 479). SPRINGER
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Amorphous x-ray diffraction is used to obtain structural information on amorphous solids and liquids at high pressure as well as other materials without long range crystalline order including biologically important macromolecules and nanomaterials. The intense x-ray beams provided by synchrotron sources are ideal for diffraction studies of noncrystalline materials. We illustrate this with studies of the transition between low- and high-density forms of amorphous Si in the diamond anvil cell at high pressure, and the compressibility of amyloid fibrils.
|Title:||AMORPHOUS X-RAY DIFFRACTION AT HIGH PRESSURE: POLYAMORPHIC SILICON AND AMYLOID FIBRILS|
|Event:||41st Course of the International School of Crystallography|
|Location:||Ettore Majorana Ctr Sci Culture, Erice, ITALY|
|Dates:||2009-06-04 - 2009-06-14|
|Keywords:||Amorphous x-ray diffraction, amorphous silicon, polyamorphism, amyloid fibrils, protein fibre diffraction|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry|
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