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AMORPHOUS X-RAY DIFFRACTION AT HIGH PRESSURE: POLYAMORPHIC SILICON AND AMYLOID FIBRILS

McMillan, PF; Daisenberger, D; Cabrera, RQ; Meersman, F; (2010) AMORPHOUS X-RAY DIFFRACTION AT HIGH PRESSURE: POLYAMORPHIC SILICON AND AMYLOID FIBRILS. In: Boldyreva, E and Dera, P, (eds.) HIGH-PRESSURE CRYSTALLOGRAPHY: FROM FUNDAMENTAL PHENOMENA TO TECHNOLOGICAL APPLICATIONS. (pp. 469 - 479). SPRINGER

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Abstract

Amorphous x-ray diffraction is used to obtain structural information on amorphous solids and liquids at high pressure as well as other materials without long range crystalline order including biologically important macromolecules and nanomaterials. The intense x-ray beams provided by synchrotron sources are ideal for diffraction studies of noncrystalline materials. We illustrate this with studies of the transition between low- and high-density forms of amorphous Si in the diamond anvil cell at high pressure, and the compressibility of amyloid fibrils.

Type:Proceedings paper
Title:AMORPHOUS X-RAY DIFFRACTION AT HIGH PRESSURE: POLYAMORPHIC SILICON AND AMYLOID FIBRILS
Event:41st Course of the International School of Crystallography
Location:Ettore Majorana Ctr Sci Culture, Erice, ITALY
Dates:2009-06-04 - 2009-06-14
ISBN-13:978-90-481-9257-1
DOI:10.1007/978-90-481-9258-8_38
Keywords:Amorphous x-ray diffraction, amorphous silicon, polyamorphism, amyloid fibrils, protein fibre diffraction
UCL classification:UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry

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