UCL logo

UCL Discovery

UCL home » Library Services » Electronic resources » UCL Discovery

Noncontact atomic force microscopy imaging of ultrathin Al2O3 on NiAl(110)

Pang, CL; Raza, H; Haycock, SA; Thornton, G; (2002) Noncontact atomic force microscopy imaging of ultrathin Al2O3 on NiAl(110). PHYS REV B , 65 (20) , Article 201401. 10.1103/PhysRevB.65.201401.

Full text not available from this repository.

Abstract

Noncontact atomic force microscopy (NC-AFM) has been used to image ultrathin film Al2O3 on NiAl(110). Atomic scale rows were observed with a 9 A periodicity. This provides support for a previous scanning tunneling microscopy study that concluded that the rows arise from the oxide rather than the underlying substrate. NC-AFM data image domain boundaries in the oxide film as either trenches or ridges, depending on the state of the tip. This suggests that NC-AFM does not simply trace the topography of the surface.

Type: Article
Title: Noncontact atomic force microscopy imaging of ultrathin Al2O3 on NiAl(110)
DOI: 10.1103/PhysRevB.65.201401
Keywords: SCANNING-TUNNELING-MICROSCOPY, ALUMINUM-OXIDE FILMS, SURFACE, TIO2(110), OXIDATION, DEFECTS
UCL classification: UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry
URI: http://discovery.ucl.ac.uk/id/eprint/1333028
Downloads since deposit
0Downloads
Download activity - last month
Download activity - last 12 months
Downloads by country - last 12 months

Archive Staff Only

View Item View Item