Pang, CL; Raza, H; Haycock, SA; Thornton, G; (2000) Growth of copper and palladium on alpha-Al2O3(0001). SURF SCI , 460 (1-3) L510 - L514.
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Non-contact atomic force microscopy (NC-AFM) has been used to image the room-temperature growth of copper and palladium on the (1 x 1) and (root 31 x root 31) R +/- 9 degrees terminations of alpha-Al2O3(0001). Three-dimensional (3D) clusters of palladium are observed on both the (1 x 1) and the (root 31 x root 31) R +/- 9 degrees terminations, with 3D clusters of copper observed on the reconstructed surface. There is evidence of step-edge-dominated growth of palladium on the (root 31 x root 31) R +/- 9 degrees termination. (C) 2000 Elsevier Science B.V. All rights reserved.
|Title:||Growth of copper and palladium on alpha-Al2O3(0001)|
|Keywords:||aluminium oxide, atomic force microscopy, copper, growth, low index single crystal surface, palladium, ATOMIC-FORCE MICROSCOPY, PD PARTICLE GROWTH, ELECTRONIC-STRUCTURE, OXIDE-FILMS, SURFACE, ALUMINA, MORPHOLOGY, TIO2(110), CLUSTERS|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry|
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