Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy.
APPLIED SURFACE SCIENCE.
(pp. 233 - 238).
ELSEVIER SCIENCE BV
We have used non-contact atomic force microscopy (NC-AFM) to study TiO2(110), identifying a row with twice the thickness of a TiO2(110)1 X 2 row. This can be explained by a [1 (1) over bar 0] extension of the added row model of TiO2(110)1 X 2. In the  direction, this reconstruction narrows into a 1 X 2 row giving strong evidence that the two structures are very closely related. For the TiO2(100) surface, we present NC-AFM data which supports the intermediate 1 X 3-beta model previously proposed on the basis of an STM experiment. (C) 2000 Elsevier Science B.V. All rights reserved.
|Title:||Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy|
|Event:||2nd International Workshop on Noncontact Atomic Force Microscopy (NC-AFM 99)|
|Dates:||1999-09-01 - 1999-09-04|
|Keywords:||NC-AFM, STM, TiO2(100), TiO2(110), SCANNING-TUNNELING-MICROSCOPY, X-RAY-DIFFRACTION, TIO2(110) SURFACE, ELECTRON-DIFFRACTION, TIO2(100)1X3, RESOLUTION, MODE|
|UCL classification:||UCL > School of BEAMS
UCL > School of BEAMS > Faculty of Maths and Physical Sciences
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