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Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy

Pang, CL; Raza, H; Haycock, SA; Thornton, G; (2000) Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy. In: APPLIED SURFACE SCIENCE. (pp. 233 - 238). ELSEVIER SCIENCE BV

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Abstract

We have used non-contact atomic force microscopy (NC-AFM) to study TiO2(110), identifying a row with twice the thickness of a TiO2(110)1 X 2 row. This can be explained by a [1 (1) over bar 0] extension of the added row model of TiO2(110)1 X 2. In the [001] direction, this reconstruction narrows into a 1 X 2 row giving strong evidence that the two structures are very closely related. For the TiO2(100) surface, we present NC-AFM data which supports the intermediate 1 X 3-beta model previously proposed on the basis of an STM experiment. (C) 2000 Elsevier Science B.V. All rights reserved.

Type:Proceedings paper
Title:Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy
Event:2nd International Workshop on Noncontact Atomic Force Microscopy (NC-AFM 99)
Location:PONTRESINA, SWITZERLAND
Dates:1999-09-01 - 1999-09-04
Keywords:NC-AFM, STM, TiO2(100), TiO2(110), SCANNING-TUNNELING-MICROSCOPY, X-RAY-DIFFRACTION, TIO2(110) SURFACE, ELECTRON-DIFFRACTION, TIO2(100)1X3, RESOLUTION, MODE
UCL classification:UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry

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