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Radio-frequency reflectometry-A fast and sensitive measurement method for two-dimensional systems.
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES.
(pp. 1192 - 1195).
ELSEVIER SCIENCE BV
We have used radio-frequency (rf) reflectometry for sensitive, large bandwidth measurements of two-dimensional (2D) systems in AlGaAs/GaAs heterostructures at millikelvin temperatures. We show that the sample geometry is important in explaining the rf response of the circuit. Our simple lumped element model, where the gated 2D system is described as a resistive transmission line, qualitatively agrees with the experimental findings. (c) 2009 Elsevier B.V. All rights reserved.
|Title:||Radio-frequency reflectometry-A fast and sensitive measurement method for two-dimensional systems|
|Event:||18th International Conference on Electronic Properties of Two-Dimensional Systems|
|Dates:||2009-07-19 - 2009-07-24|
|Keywords:||Radio-frequency, Reflectometry, Two-dimensional systems|
|UCL classification:||UCL > School of BEAMS
UCL > School of BEAMS > Faculty of Engineering Science
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