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Radio-frequency reflectometry-A fast and sensitive measurement method for two-dimensional systems

Taskinen, LJ; Starrett, RP; Martin, TP; Chen, JCH; Micolich, AP; Hamilton, AR; Simmons, MY; (2010) Radio-frequency reflectometry-A fast and sensitive measurement method for two-dimensional systems. In: PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES. (pp. 1192 - 1195). ELSEVIER SCIENCE BV

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Abstract

We have used radio-frequency (rf) reflectometry for sensitive, large bandwidth measurements of two-dimensional (2D) systems in AlGaAs/GaAs heterostructures at millikelvin temperatures. We show that the sample geometry is important in explaining the rf response of the circuit. Our simple lumped element model, where the gated 2D system is described as a resistive transmission line, qualitatively agrees with the experimental findings. (c) 2009 Elsevier B.V. All rights reserved.

Type: Proceedings paper
Title: Radio-frequency reflectometry-A fast and sensitive measurement method for two-dimensional systems
Event: 18th International Conference on Electronic Properties of Two-Dimensional Systems
Location: Kobe, JAPAN
Dates: 2009-07-19 - 2009-07-24
DOI: 10.1016/j.physe.2009.11.124
Keywords: Radio-frequency, Reflectometry, Two-dimensional systems
UCL classification: UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering
URI: http://discovery.ucl.ac.uk/id/eprint/1311657
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