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Study of electrical transport properties of (U1-xYx)Ru2Si2

Radha, S; Park, JG; Roy, SB; Coles, BR; Nigam, AK; McEwen, KA; (1996) Study of electrical transport properties of (U1-xYx)Ru2Si2. In: PHYSICA B-CONDENSED MATTER. (pp. 195 - 197). ELSEVIER SCIENCE BV

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Abstract

Electrical resistivity and magnetoresistance (Delta rho/rho) measurements on a series of (U1-xYx)Ru2Si2 (0 less than or equal to x less than or equal to 0.9) compounds in the temperature range 4.2-300 K and in magnetic fields up to 45 kOe are reported. The resistivity measurements do not show any signature of antiferromagnetism for x > 0.5. The compound URu2Si2 exhibits a large, positive (Delta rho/rho) presumably due to destruction of Kondo coherence as well as due to antiferromagnetism. The presence of even 5% Y at U-site weakens the Kondo coherence and reduces the magnetoresistance considerably.

Type: Proceedings paper
Title: Study of electrical transport properties of (U1-xYx)Ru2Si2
Event: International Conference on Strongly Correlated Electron Systems (SCES 95)
Location: GOA, INDIA
Dates: 1995-09-27 - 1995-09-30
Keywords: URU2SI2
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Physics and Astronomy
URI: http://discovery.ucl.ac.uk/id/eprint/1309933
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