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Conduction-atomic force microscopy study of H-2 sensing mechanism in Pd nanoparticles decorated TiO2 nanofilm

Kumar, MK; Tan, LK; Gosvami, NN; Gao, H; (2009) Conduction-atomic force microscopy study of H-2 sensing mechanism in Pd nanoparticles decorated TiO2 nanofilm. J APPL PHYS , 106 (4) , Article 044308. 10.1063/1.3202344.

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Abstract

In situ conduction-AFM is used to observe room temperature hydrogen gas response mechanism of Pd nanoparticles decorated TiO2 nanofilm. The response mechanism is due to chemical and electronic sensitization of the nanofilm. The nanofilm with thickness similar to 5 nm, in range of the wall thickness of a typical TiO2 nanotube, is prepared by atomic layer deposition. For the mechanism study and also for hydrogen sensor applications, this nanofilm with electrical conduction switching from the order of picoampere in air, to similar to 0.30 mu A in 1000 ppm H-2 is an alternative to TiO2 nanotube/nanostructures. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3202344]

Type:Article
Title:Conduction-atomic force microscopy study of H-2 sensing mechanism in Pd nanoparticles decorated TiO2 nanofilm
DOI:10.1063/1.3202344
Keywords:GAS SENSORS, TITANIA NANOTUBES, ROOM-TEMPERATURE, LAYER DEPOSITION, HYDROGEN SENSOR, METAL, FILMS, SNO2, SPECTROSCOPY, CATALYSIS
UCL classification:UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry

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