Kumar, MK; Tan, LK; Gosvami, NN; Gao, H; (2009) Conduction-atomic force microscopy study of H-2 sensing mechanism in Pd nanoparticles decorated TiO2 nanofilm. J APPL PHYS , 106 (4) , Article 044308. 10.1063/1.3202344.
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In situ conduction-AFM is used to observe room temperature hydrogen gas response mechanism of Pd nanoparticles decorated TiO2 nanofilm. The response mechanism is due to chemical and electronic sensitization of the nanofilm. The nanofilm with thickness similar to 5 nm, in range of the wall thickness of a typical TiO2 nanotube, is prepared by atomic layer deposition. For the mechanism study and also for hydrogen sensor applications, this nanofilm with electrical conduction switching from the order of picoampere in air, to similar to 0.30 mu A in 1000 ppm H-2 is an alternative to TiO2 nanotube/nanostructures. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3202344]
|Title:||Conduction-atomic force microscopy study of H-2 sensing mechanism in Pd nanoparticles decorated TiO2 nanofilm|
|Keywords:||GAS SENSORS, TITANIA NANOTUBES, ROOM-TEMPERATURE, LAYER DEPOSITION, HYDROGEN SENSOR, METAL, FILMS, SNO2, SPECTROSCOPY, CATALYSIS|
|UCL classification:||UCL > School of BEAMS > Faculty of Maths and Physical Sciences > Chemistry|
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