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Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy

Mitrofanov, O; Tan, T; Mark, PR; Bowden, B; Harrington, JA; (2009) Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy. APPL PHYS LETT , 94 (17) , Article 171104. 10.1063/1.3126053.

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Abstract

Propagation of terahertz waves in hollow metallic waveguides depends on the waveguide mode. Near-field scanning probe terahertz microscopy is applied to identify the mode structure and composition in dielectric-lined hollow metallic waveguides. Spatial profiles, relative amplitudes, and group velocities of three main waveguide modes are experimentally measured and matched to the HE11, HE12, and TE11 modes. The combination of near-field microscopy with terahertz time-resolved spectroscopy opens the possibility of waveguide mode characterization in the terahertz band.

Type:Article
Title:Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy
DOI:10.1063/1.3126053
Keywords:submillimetre wave imaging, submillimetre wave propagation, terahertz wave imaging, terahertz waves, waveguides, RADIATION, TRANSMISSION, PROPAGATION, FIBERS
UCL classification:UCL > School of BEAMS > Faculty of Engineering Science > Electronic and Electrical Engineering

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