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Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements

Hofmann, F; Phillips, NW; Harder, RJ; Liu, W; Clark, JN; Robinson, IK; Abbey, B; (2017) Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements. Journal of Synchrotron Radiation , 24 (Pt 5) pp. 1048-1055. 10.1107/S1600577517009183. Green open access

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Abstract

Multi-reflection Bragg coherent diffraction imaging has the potential to allow three-dimensional (3D) resolved measurements of the full lattice strain tensor in specific micro-crystals. Until now such measurements were hampered by the need for laborious, time-intensive alignment procedures. Here a different approach is demonstrated, using micro-beam Laue X-ray diffraction to first determine the lattice orientation of the micro-crystal. This information is then used to rapidly align coherent diffraction measurements of three or more reflections from the crystal. Based on these, 3D strain and stress fields in the crystal are successfully determined. This approach is demonstrated on a focused ion beam milled micro-crystal from which six reflections could be measured. Since information from more than three independent reflections is available, the reliability of the phases retrieved from the coherent diffraction data can be assessed. Our results show that rapid, reliable 3D coherent diffraction measurements of the full lattice strain tensor in specific micro-crystals are now feasible and can be successfully carried out even in heavily distorted samples.

Type: Article
Title: Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements
Location: United States
Open access status: An open access version is available from UCL Discovery
DOI: 10.1107/S1600577517009183
Publisher version: https://doi.org/10.1107/S1600577517009183
Language: English
Additional information: This version is the version of record. For information on re-use, please refer to the publisher’s terms and conditions.
Keywords: Bragg coherent diffraction imaging, ion implantation, micro-beam Laue diffraction, strain tensor measurement
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: http://discovery.ucl.ac.uk/id/eprint/10039600
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